Facilities

TEM & FIB

Transmission Electron Microscope · 연구1동

Thermofisher SpectraUltra

That can truly be operated at different voltages (all the voltages between 30 and 300 kV for which alignments were purchased) in a single microscopy session
Where changing from an accelerating voltage to any other one takes about 5 minutes
That can accommodate a radically different EDX concept with a 4.45 srad solid angle (4.04 srad solid angle with an analytical double tilt holder)

With the new Spectra Ultra S/TEM, the accelerating voltage becomes an adjustable parameter, just like probe current, and the massive Ultra-X EDX system enables chemical characterization of materials too beam-sensitive for conventional EDX analysis.

Transmission Electron Microscope · 연구1동

Thermofisher Spectra200

Probe-corrected S/TEM equipped with X-CFEG for ultra-high-brightness electron beam operation
Flexible accelerating voltage range from 30 to 200 kV for high-resolution imaging and analytics
STEM resolution of 60 pm at 200 kV, with high-resolution performance retained at lower accelerating voltages
Equipped with Super-X EDS, Thermo Scientific Ceta 16M Camera, Panther STEM detector system, and Dectris ARINA detector

The Thermo Fisher Scientific Spectra200 S/TEM is a state-of-the-art probe-corrected scanning transmission electron microscope designed for high-throughput, aberration-corrected imaging and analytical characterization of materials. Powered by an ultra-high-brightness X-CFEG source, the system enables high-resolution STEM imaging across a flexible accelerating voltage range from 30 to 200 kV. With advanced detectors including Super-X EDS, the Panther STEM detection system, Thermo Scientific Ceta 16M Camera, and Dectris ARINA detector, the Spectra200 supports high-sensitivity imaging, fast STEM analytics, 4D-STEM experiments, and quantitative elemental analysis for a wide range of materials research applications.

Focused Ion Beam · 연구1동

Thermo Scientific Helios 5

Highest-quality, site-specific, sample preparation for TEM using the new high throughput Tomahawk HT Ion Column
Fastest and easiest, fully automated, unattended, multisite in situ and ex situ TEM sample preparation and cross sectioning using optional AutoTEM 5 Software
Fast, accurate and precise milling and deposition of complex structures with critical dimensions of less than 10 nm
The most complete sample information with sharp, refined and charge-free contrast obtained from up to six integrated in-column and below-the-lens detectors

In-situ holder

In-situ TEM-straining holder · 연구1동

Gatan 654

In situ tensile testing of specifically designed sample inside TEM
Mode of mechanical testing: Straining

In-situ TEM-biasing & Heating holder · 연구1동

Protochips Fusion

In situ electrical & thermal studies of specimen under controlled and stable environment within TEM

In-situ TEM-gas holder · 연구1동

Protochips Atmosphere

In situ gas reaction & thermal studies of specimen under a high pressure and elevated or room temperature within TEM